Contacts: David Eldon

Short Description

CER data gathering, quality filtering, ELM filtering, and selection

Long Description

This module was developed to provide quick and simple access to CER data for the Kolemen Group automatic kinetic EFIT project. However, it may be useful in other projects that need a lightweight CER data gathering tool without the complexity of a large profile fitting module. So, go ahead and use this submodule as an ingredient in your project if you want to.

Typical workflows

This module is used to:

  • Gather CER data

  • Filter CER data based on fractional uncertainty and other quality considerations (outlier rejection)

  • Filter CER data based on ELM timing

  • Return groups of filtered x, y, and uncertainty data within specified time windows as inputs to profile analysis

Relevant publications

If CER data are used in your work, please cite:

  • K.H. Burrell, et al., “Improved charge-coupled device detectors for high-speed, charge exchange spectroscopy studies on the DIII-D tokamak”, Review of Scientific Instruments 75, 3455 (2004); doi: 10.1063/1.1787949

  • or check for a more appropriate reference at: https://diii-d.gat.com/diii-d/Diag/cer/references


List of contributors sorted by number of lines authored:

3664 David Eldon
 211 Z. Anthony Xing
 126 Matthijs Roelofs
  44 Fusion Bot
  12 Oak Nelson
   1 Severin Denk
   1 Orso Meneghini


List of usernames sorted by number of module imports: eldond, nelsonand, ashourvana, huqiming, jianx, roelofsm